Dear colleagues,
In collaboration with the North American Ellipsometry Association,
the AVS 72 · EL – Call for Abstracts is now open.
American Vacuum Society (AVS) 72nd International Symposium & Exhibition
Spectroscopic Ellipsometry (EL) Technical Group
📢 Submit your abstract before May 18, 2026, and select EL sessions!
Please circulate this AVS 72 · EL – Call for Abstracts with your professional networks!
🧑🏫 EL1: Spectroscopic Ellipsometry (Oral Session)
🧑🏫 EL2: In-Situ Ellipsometry for Atomic Scale Processing (Oral Session)
This session will be part of the Atomic Scale Processing (AP) Mini Symposium, in collaboration with the Thin Film (TF), Plasma Science & Technology (PS), Electronics Materials & Photonics (EM) Divisions, and Spectroscopic Ellipsometry (EL) Technical Group.
📃 EL3: Spectroscopic Ellipsometry (Poster Session)
The Program of the Spectroscopic Ellipsometry (EL) Technical Group covers ellipsometry as an optical, polarization-resolved metrology technique to study & understand materials, thin films, and interface systems across fabrication, characterization, and application-driven research. Abstracts must emphasize how ellipsometry provides quantitative access to optical, electronic, and/or structural properties or reveals direct connections between optical response, material growth, and/or functional performance. Highlights include advances in ellipsometry instrumentation & analysis methods that improve sensitivity or offer novel insights across a range of studies, including atomic-scale thin-film evolution, interface processes, photochromic transitions, complex anisotropic systems, or optical chirality of spatially heterogeneous nanostructures. The EL Program will further encompass real-time growth monitoring, detailed optical modeling, emerging application spaces, etc., to reflect the evolving role of ellipsometry as an enabling platform for modern materials science & engineering.
We look forward to seeing you November 8-13, 2026, in Pittsburgh, Pennsylvania!
Best regards,
UFUK, Andy, Nik, Mathias, Marcel
AVS 72 · EL Program Committee

