North American Ellipsometry Association

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NAEA Fellows

For the purpose of providing recognition to deserving Members of the North American Ellipsometry Association (NAEA) who have made sustained and outstanding technical contributions in areas of interest to the Association, a current Member may be elected as a “Fellow of the Association.”  No more than one Fellow per year may be elected.

Eligibility

There shall be elected to Fellowship only such Members who have made outstanding contributions in research, engineering, technical or managerial leadership, and/or education for a period of 10 years or more.  Continuous Membership in the Association for a minimum period of 2 years prior to nomination is required to be a candidate for Fellowship.

Nominations

A candidate for Fellowship may be nominated by any Member of the Association.  Each Member may make only one nomination in one calendar year.

A nomination form signed by the nominating Member and citing the principal contributions of the candidate shall be sent to the Secretary.  The form shall include the names of three other Association Members who can provide evaluations of the nominee’s accomplishments.  The Secretary shall send recommendation forms to the three evaluators identified by the nominator.  The nomination form and recommendation letters from the three evaluators will be submitted to the Board for review.

The nomination of a candidate for Fellow shall remain active for two years (the year of initial nomination and the following year).  If a candidate is not elected to Fellowship in the first year of nomination, the nominator may choose to update and resubmit the nomination form.

A candidate may be re-nominated by submission of a new and complete nomination form.

Voting

A simple majority vote of the Directors at the Annual Meeting of the Members shall approve an inductee to Fellowship for that year (if any).  In the case of a tie vote, the President shall select the inductee to Fellowship for that year.

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Latest Announcements

  • North American Ellipsometry Association LinkedIn Group Grows 300 Members Strong!

    🌟 Join Us in Celebrating:
    We are proud to announce that the North American Ellipsometry Association LinkedIn Group has grown to 300 members since its formation in 2023. We highly appreciate the connectedness and dedication of everyone within the ellipsometry community.
    As we celebrate this milestone, we encourage you to invite additional colleagues and peers to join this growing network and share your insights, experiences, and questions to enrich the discourse in the field. Your participation and contributions are key to our collective success.

    📢 Looking Ahead to AWE-1:
    We cordially invite you to the 1st American Workshop on Ellipsometry (AWE-1), to be held February 28 – March 3, 2027, in Lincoln, Nebraska.
    Mark your calendars and stay tuned for more information on the workshop website!

    💡 About Us:
    The North American Ellipsometry Association (NAEA) is a nonprofit organization to promote the dissemination of knowledge, education, and research in the use of optical methods that exploit the polarization properties of light to investigate broadly optical materials properties for use in advanced and widespread applications such as in semiconductor, automotive, aviation, renewables, biomedical, and health care for the betterment of humanity.

    📜 Purposes:
    The Ellipsometry Association is organized exclusively for charitable, educational, and scientific purposes within the meaning of Section 501(c)(3) of the Internal Revenue Code. Within such purposes, the specific Purposes of the Association are:
    1️⃣ To provide a forum for scientific and technical discussions on the use of optical methods which exploit the polarization properties of light, their applications to materials characterization, and their improvements through continued technological and scientific advancements.
    2️⃣ To provide continuing education through the organization and sponsorship of symposia, topical conferences, short courses, workshops, and exhibits.
    3️⃣ To promote student participation in national and local scientific and technological activities, science fairs and competitions, and other appropriate measures.
    4️⃣ To recognize excellence in science and technology through the presentation of awards.
    5️⃣ To disseminate information through the publication of topical conference proceedings, monographs, video tapes, and recommended practices.
    6️⃣ To cooperate with other societies to advance common goals fostering the growth and development of intellectual resources in science and engineering disciplines.

  • AVS 72 · Spectroscopic Ellipsometry (EL) – Call for Abstracts

    Dear colleagues,

    In collaboration with the North American Ellipsometry Association,
    the AVS 72 · EL – Call for Abstracts is now open.

    American Vacuum Society (AVS) 72nd International Symposium & Exhibition
    Spectroscopic Ellipsometry (EL) Technical Group

    📢 Submit your abstract before May 18, 2026, and select EL sessions!
    Please circulate this AVS 72 · EL – Call for Abstracts with your professional networks!

    🧑‍🏫 EL1:  Spectroscopic Ellipsometry  (Oral Session)
    🧑‍🏫 EL2:  In-Situ Ellipsometry for Atomic Scale Processing  (Oral Session)
    This session will be part of the Atomic Scale Processing (AP) Mini Symposium, in collaboration with the Thin Film (TF), Plasma Science & Technology (PS), Electronics Materials & Photonics (EM) Divisions, and Spectroscopic Ellipsometry (EL) Technical Group.
    📃 EL3:  Spectroscopic Ellipsometry  (Poster Session)

    The Program of the Spectroscopic Ellipsometry (EL) Technical Group covers ellipsometry as an optical, polarization-resolved metrology technique to study & understand materials, thin films, and interface systems across fabrication, characterization, and application-driven research. Abstracts must emphasize how ellipsometry provides quantitative access to optical, electronic, and/or structural properties or reveals direct connections between optical response, material growth, and/or functional performance. Highlights include advances in ellipsometry instrumentation & analysis methods that improve sensitivity or offer novel insights across a range of studies, including atomic-scale thin-film evolution, interface processes, photochromic transitions, complex anisotropic systems, or optical chirality of spatially heterogeneous nanostructures. The EL Program will further encompass real-time growth monitoring, detailed optical modeling, emerging application spaces, etc., to reflect the evolving role of ellipsometry as an enabling platform for modern materials science & engineering.

    We look forward to seeing you November 8-13, 2026, in Pittsburgh, Pennsylvania!

    Best regards,
    UFUK, Andy, Nik, Mathias, Marcel
    AVS 72 · EL Program Committee

    AVS 72 · EL – Call for AbstractsDownload