North American Ellipsometry Association

Log in

Rasheed M. A. Azzam Medal

This Award is dedicated to Rasheed Mohammed Abdel-Gawad Azzam.

Rasheed Mohammed Abdel-Gawad Azzam

University of New Orleans 

Rasheed Mohammed Abdel-Gawad Azzam received his bachelor’s degree in science from Cairo University and his doctorate from the University of Nebraska, where he held postdoctoral and faculty positions.  In 1979, he joined the University of New Orleans (UNO) as an electrical engineering professor, where he taught for more than four decades.  In 1982, he became a member of UNO’s inaugural class of faculty members who were recognized with the title of Distinguished Professor.  He was also a Fulbright Scholar and Visiting Professor at the Université de Provence in France and a Professor of Physics at the American University in Cairo.  His research interests included polarized light:  its mathematical representations and physical measurement;  ellipsometry:  its theory, instrumentation, and applications for the characterization of surfaces and thin films;  optical polarimetry based on reflective silicon detectors and diffraction gratings;  optics of thin films and design of optical devices for polarized light;  optics of anisotropic media and liquid crystals;  and the theory of reflection.  His book “Ellipsometry and Polarized Light” has been cited over 10,000 times and translated into several languages.  He served as a topical editor for the Journal of the Optical Society of America (OSA) and Applied Optics, and as a member of the OSA Publications Council.  His honors include the 2005 GG Stokes Award of SPIE, International Society for Optical Engineering;  the 1993 Photonics Circle of Excellence Award;  the 1993 R and D Award;  the 1988 Outstanding American Inventor;  and Fellow of the Optical Society of America and SPIE.

The North American Ellipsometry Association (NAEA), in collaboration with the American Vacuum Society (AVS) Spectroscopic Ellipsometry (EL) Technical Group, is establishing this Award as the main recognition for the American Workshop on Ellipsometry (AWE) series.

The Ellipsometry Association and AVS · EL Technical Group are seeking financial support to permanently fund this Award for future AWE meetings.

Purpose

The Rasheed M. A. Azzam Medal is intended to celebrate an individual or a group of individuals for recent, groundbreaking contributions to the field of ellipsometry and related techniques, whether through instrument innovations;  through academic, technical, or industrial applications;  or through mentorship, education, and outreach.

Nature

The Rasheed M. A. Azzam Medal consists of:  a commemorative medallion and/or certificate, stating the title of the Award, the details of the AWE event, and the name of the awardee;  plus a monetary prize of $_TBD_.

Eligibility & Nomination

Nominations and self-nominations are solicited from the broader ellipsometry community.  Nominees for the Rasheed M. A. Azzam Medal shall be appropriate to the Purpose of this Award specified above.

Nomination packages must contain the nominees’ concise CV;  a comprehensive, ca. 2-page description of contributions to be considered;  and a complete list of patents, publications, and/or other relevant achievements.  Nomination packages must be submitted to the Chair of the respective AWE Awards Committee by the specified deadline.

The AWE Awards Committee will review all nominations and select the winner of the Rasheed M. A. Azzam Medal.

Registry of Awardees

AWE-1 (2027)

The inaugural Rasheed M. A. Azzam Medal will be presented at the 1st American Workshop on Ellipsometry (AWE-1) in Lincoln, Nebraska, during the Awards Ceremony scheduled for March 3, 2027.

Site Navigation

Latest Announcements

  • AWE-1 · Call for Abstracts & Award Nominations

    The 1st American Workshop on Ellipsometry (AWE-1) will be held February 28 – March 3, 2027, at the Conference Center on the Nebraska Innovation Campus in Lincoln, Nebraska.

    AWE-1 is the inaugural workshop & exhibition organized and sponsored by the North American Ellipsometry Association (NAEA).  It is further endorsed by the American Vacuum Society (AVS) as the First Topical Conference & Exhibition of the Spectroscopic Ellipsometry (EL) Technical Group.

    Call for Abstracts

    The workshop Committees invite students, early-career professionals, and experienced leaders across academic, public, and industrial sectors to contribute an abstract. International participants are welcome and expressly encouraged to attend.

    AWE-1 is especially dedicated to the participation of undergraduate and graduate students.  Accordingly, we aim to keep students’ attendance and lodging costs as affordable as possible—thanks to the generous support of our Sponsors. Workshop Registration will be $200 for Students and $400 for Regular attendees.

    The Technical Program will include a broad range of topics in ellipsometry, polarimetry, and related techniques that utilize polarized light to characterize bulk materials, thin films, surfaces, interfaces, and nanostructures under both static and dynamic conditions. Topics will cover theory, instrumentation & data analysis, and applications across physics, chemistry, materials science, and life sciences, as well as engineering and metrology.

    Please prepare abstracts according to the Author Instructions and
    submit via the Abstract Submission System before October 31, 2026!

    Abstracts should cover work that has been published recently or is yet unpublished. Abstracts must contain sufficient information to allow for peer review by the Program Committee. Abstracts will be evaluated upon receipt. Acceptance notifications will be sent at the beginning of November 2026. Please submit early!

    In the abstract, please identify the corresponding and presenting authors. For student presenters who wish to participate in the Student Award competition, please identify the student status in the abstract. If the presenting author cannot attend the workshop, please arrange for another co-author to attend and present, and inform the workshop organizers as soon as possible.

    Contributed presentations will be included in a digital Abstract Booklet and scheduled into Oral or Poster Sessions with dates and times assigned as the Program Schedule is finalized. The Abstract Booklet & Program Schedule will be published on the workshop website. Oral Sessions are currently anticipated as single-track.

    The Technical Program includes complimentary Tutorials; Oral and Poster Sessions with a Keynote, 101 Lectures, and Invited Talks; and Social Events—providing ample opportunities for scientific and technical discussions and professional networking.  An Awards Ceremony will celebrate an inaugural NAEA Fellow, recipient of the Rasheed M. A. Azzam Medal, and multiple Student Awardees. A simultaneous Industry Exhibition will showcase the latest equipment developments.

    Call for Award Nominations

    We are pleased to announce this Call for Award Nominations. The following awards will recognize and honor excellent achievements at different levels.

    Award Categories

    NAEA Fellow

    For the purpose of providing recognition to deserving Members of the North American Ellipsometry Association (NAEA) who have made sustained and outstanding technical contributions in areas of interest to the Association, one current Member may be elected as a “Fellow of the Association.”  The nominee to be inducted as NAEA Fellow shall have made outstanding contributions in research, engineering, technical or managerial leadership, and/or education for a period of 10 years or more.

    Rasheed M. A. Azzam Medal

    The Rasheed M. A. Azzam Medal is intended to celebrate an individual or a group of individuals for recent, groundbreaking contributions to the field of ellipsometry and related techniques, whether through instrument innovations;  through academic, technical, or industrial applications;  or through mentorship, education, and outreach.

    Student Awards

    Student Awards are intended to recognize undergraduate or graduate students for best oral presentations and for best posters.  Multiple awardees are anticipated.
    Students must identify their undergraduate or graduate student status upon Abstract Submission to participate in the Student Award competitions.  All presenting authors who have indicated student status at the time of abstract submission are automatically considered.

    Nomination Instructions

    Please submit Nominations for the NAEA Fellow and/or for the Rasheed M. A. Azzam Medal to the Awards Committee at awards@ellipsometry.us.  Nominations and self-nominations are permitted.  Please click the respective link above to find more information about each Award, including the required materials for Award Nominations.

    Please submit Award Nominations no later than December 31, 2026!

    Award winners will be informed by February 14, 2027.  Student Award winners will be determined based on evaluations during the workshop.

    Thank you for helping us celebrate excellence in ellipsometry.  We look forward to your Nominations!

    Organizing Committee

    Eva Schubert (University of Nebraska-Lincoln)
    Yousra Traouli (University of Nebraska-Lincoln)
    Preston Sorensen (University of Nebraska-Lincoln)
    Marcel Junige (University of Colorado Boulder)
    Rafał Korlacki (J.A. Woollam Co., Inc.)
    Megan Stokey (Milwaukee School of Engineering)
    Ufuk Kılıç (University of Nebraska-Lincoln)
    Alyssa Mock (Weber State University)
    Mathias Schubert (University of Nebraska-Lincoln)

  • North American Ellipsometry Association LinkedIn Group Grows 300 Members Strong!

    🌟 Join Us in Celebrating:
    We are proud to announce that the North American Ellipsometry Association LinkedIn Group has grown to 300 members since its formation in 2023. We highly appreciate the connectedness and dedication of everyone within the ellipsometry community.
    As we celebrate this milestone, we encourage you to invite additional colleagues and peers to join this growing network and share your insights, experiences, and questions to enrich the discourse in the field. Your participation and contributions are key to our collective success.

    📢 Looking Ahead to AWE-1:
    We cordially invite you to the 1st American Workshop on Ellipsometry (AWE-1), to be held February 28 – March 3, 2027, in Lincoln, Nebraska.
    Mark your calendars and stay tuned for more information on the workshop website!

    💡 About Us:
    The North American Ellipsometry Association (NAEA) is a nonprofit organization to promote the dissemination of knowledge, education, and research in the use of optical methods that exploit the polarization properties of light to investigate broadly optical materials properties for use in advanced and widespread applications such as in semiconductor, automotive, aviation, renewables, biomedical, and health care for the betterment of humanity.

    📜 Purposes:
    The Ellipsometry Association is organized exclusively for charitable, educational, and scientific purposes within the meaning of Section 501(c)(3) of the Internal Revenue Code. Within such purposes, the specific Purposes of the Association are:
    1️⃣ To provide a forum for scientific and technical discussions on the use of optical methods which exploit the polarization properties of light, their applications to materials characterization, and their improvements through continued technological and scientific advancements.
    2️⃣ To provide continuing education through the organization and sponsorship of symposia, topical conferences, short courses, workshops, and exhibits.
    3️⃣ To promote student participation in national and local scientific and technological activities, science fairs and competitions, and other appropriate measures.
    4️⃣ To recognize excellence in science and technology through the presentation of awards.
    5️⃣ To disseminate information through the publication of topical conference proceedings, monographs, video tapes, and recommended practices.
    6️⃣ To cooperate with other societies to advance common goals fostering the growth and development of intellectual resources in science and engineering disciplines.