Conferences & Workshops

A specific Purpose of the North American Ellipsometry Association (NAEA) is to provide a forum for scientific and technical discussions, and to provide continuing education through the organization and sponsorship of symposia, topical conferences, short courses, workshops, and exhibits.  The Association endeavors to organize and conduct biennial national symposia on science and technology topics of interest to the Association and its Members.



Past

10th International Conference on Spectroscopic Ellipsometry (ICSE-10):  June 8-13, 2025, in Boulder, CO, USA


Brief History of ICSE

The International Conference on Spectroscopic Ellipsometry (ICSE) series was founded in 1993 and is held approximately every three years to share new ideas related to ellipsometric and optical characterization applications such as materials characterization, real-time process analysis and control, and instrumentation development that takes advantage of the polarization properties of electromagnetic radiation in the spectral region from terahertz to soft-x-ray wavelengths.  ICSE meetings bring together an international cohort of experienced scientists and leaders of the community, as well as postdoctoral research associates, other early-career professionals, graduate and undergraduate students.

At the ICSE-10 in 2025, the organizers and attendees looked back in appreciation of not only how far the field has come, but also how far science and technology has evolved.

The present ICSE series follows three symposia/ conferences on ellipsometry, without the adjective “spectroscopic”.  These meetings were held at the National Bureau of Standards (now NIST) in Washington, DC, in 1963, at the University of Nebraska-Lincoln in 1968, and in Paris in 1983.  The foreword of the 1963 proceedings noted that “an important responsibility of the NBS is the development and improvement of measurement techniques and the dissemination of information about them.”

All three precursor proceedings make for an interesting reading still today, not only because the absence of spectroscopy resulted in severely limited possibilities regarding applications, but also because the first two proceedings include audience questions and comments.  In the first two symposia, much time was spent interpreting the Fresnel equations and studying time-dependent processes, such as oxidation and annealing.  Difficulties in accurately determining the null condition for null ellipsometers precluded efforts at spectroscopy.  Only the 546.1 nm wavelength of the mercury green line was largely understood.  However, by the time of the 1983 Paris conference, this had begun to change.  A decade later, by the 1993 Paris conference, spectroscopic ellipsometry had already been well established.

Please find a link collection of past conference/ symposium proceedings here!

  • AVS 72 · Spectroscopic Ellipsometry (EL) – Call for Abstracts

    Dear colleagues,

    In collaboration with the North American Ellipsometry Association,
    the AVS 72 · EL – Call for Abstracts is now open.

    American Vacuum Society (AVS) 72nd International Symposium & Exhibition
    Spectroscopic Ellipsometry (EL) Technical Group

    📢 Submit your abstract before May 18, 2026, and select EL sessions!
    Please circulate this AVS 72 · EL – Call for Abstracts with your professional networks!

    🧑‍🏫 EL1:  Spectroscopic Ellipsometry  (Oral Session)
    🧑‍🏫 EL2:  In-Situ Ellipsometry for Atomic Scale Processing  (Oral Session)
    This session will be part of the Atomic Scale Processing (AP) Mini Symposium, in collaboration with the Thin Film (TF), Plasma Science & Technology (PS), Electronics Materials & Photonics (EM) Divisions, and Spectroscopic Ellipsometry (EL) Technical Group.
    📃 EL3:  Spectroscopic Ellipsometry  (Poster Session)

    The Program of the Spectroscopic Ellipsometry (EL) Technical Group covers ellipsometry as an optical, polarization-resolved metrology technique to study & understand materials, thin films, and interface systems across fabrication, characterization, and application-driven research. Abstracts must emphasize how ellipsometry provides quantitative access to optical, electronic, and/or structural properties or reveals direct connections between optical response, material growth, and/or functional performance. Highlights include advances in ellipsometry instrumentation & analysis methods that improve sensitivity or offer novel insights across a range of studies, including atomic-scale thin-film evolution, interface processes, photochromic transitions, complex anisotropic systems, or optical chirality of spatially heterogeneous nanostructures. The EL Program will further encompass real-time growth monitoring, detailed optical modeling, emerging application spaces, etc., to reflect the evolving role of ellipsometry as an enabling platform for modern materials science & engineering.

    We look forward to seeing you November 8-13, 2026, in Pittsburgh, Pennsylvania!

    Best regards,
    UFUK, Andy, Nik, Mathias, Marcel
    AVS 72 · EL Program Committee

  • 1st American Workshop on Ellipsometry (AWE-1)

    Dear Ellipsometry Community in North America,

    We look forward to welcoming you to the 1st American Workshop on Ellipsometry (AWE-1) to be held February 28 – March 3, 2027, in Lincoln, Nebraska.  Lincoln offers a rich history of more than 60 years in the science and engineering of ellipsometry.  The venue will be located on the Nebraska Innovation Campus.

    AWE-1 will be the inaugural workshop & exhibition organized and sponsored by the North American Ellipsometry Association (NAEA).  This meeting aims to bring together experienced leaders, early-career professionals, and especially students from various academic, public, and industrial sectors.  The main purpose is to provide a forum for beginners and experts alike to learn, exchange, and share scientific and technological knowledge, as well as recent advancements, regarding ellipsometry and related techniques.  International participants are welcome and expressly encouraged.

    The Organizing Committee consists of:  Eva Schubert (University of Nebraska-Lincoln), Megan Stokey (Milwaukee School of Engineering), Alyssa Mock (Weber State University), Marcel Junige (University of Colorado Boulder), Rafał Korlacki (J. A. Woollam Co., Inc.), Ufuk Kılıç (University of Nebraska-Lincoln), Preston Sorensen (University of Nebraska-Lincoln), Yousra Traouli (University of Nebraska-Lincoln), and Mathias Schubert (University of Nebraska-Lincoln).  Additional Committees for specific tasks are still being formed and will be announced soon.  Volunteers are cordially invited!

    Distinguished Tutorial and Invited Speakers are anticipated to cover ellipsometry fundamentals, as well as more specialized applications.  A Call for Abstracts, including detailed submission instructions, will be circulated soon.

    Exhibitor information and a Prospectus for sponsorship opportunities are currently in preparation and will be provided very soon.

    Meanwhile, please mark your calendars and stay tuned for further announcements!  We will disseminate all information via the AWE-1 website, the NAEA LinkedIn Group, and an AWE-1 email newsletter.

    We look forward to seeing you in Lincoln, NE, in early 2027!

    Best regards,
    Eva, Megan, Alyssa, Marcel, Rafał, Ufuk, Preston, Yousra, and Mathias
    AWE-1 Organizing Committee