The International Conference on Spectroscopic Ellipsometry (ICSE) has been held since before the inception of the North American Ellipsometry Association (NAEA). The list below contains external links to respective conference/ symposium proceedings, issued by various publishers.
ICSE-10: June 8-13, 2025, in Boulder, CO, USA
ICSE-9: May 22-28, 2022, in Beijing, China
ICSE-8: May 26-31, 2019, in Barcelona, Spain
ICSE-7: June 6-10, 2016, in Berlin, Germany
ICSE-VI: May 26-31, 2013, in Kyoto, Japan
ICSE-V: May 23-29, 2010, 2010, in Albany, NY, USA
ICSE-4: June 11-15, 2007, in Stockholm, Sweden
ICSE-3: July 6-11 2003, in Vienna, Austria
ICSE-2: May 12-15, 1997, in Charleston, SC, USA
ICSE-1: January 11-14, 1993, in Paris, France
International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis: June 7-10, 1983, in Paris, France
Symposium on Recent Developments in Ellipsometry: August 7-9, 1968, in Lincoln, NE, USA
Ellipsometry in the Measurement of Surfaces and Thin Films, Symposium Proceedings: September 5-6, 1963, in Washington, DC, USA